FEI Quanta 250 FEG Scanning Electron Microscope

Scanning electron microscopy is a very versatile tool in biology and materials characterization. The chamber of the SEM is a lab inside which several signals are generated due to the electron-sample interaction. Our SEM is configured to take advantage of many of that signals to obtaine a valuable morphological and compositional characterization of the samples through several detectors and accessories.

  • Everhart-Thornley detector of secondary electrons for high vacuum applications providing topographical information
  • High contrast backscattered electron detector optimized to work with low voltages: vCD detector. Usable in high-vacuum and low vacuum modes, provides topographical and compositional contrast.
  • Scanning-transmission electron microscopy detector (STEM) for high vacuum applications. Allows to introduce 8 grids in one vacuum cycle and to perform bright field and dark field analysis.
  • Large field detector (LFD) for low vacuum and ESEM applications. Allows working in SE and BSE modes and facilitates the observation of large fields of view.
  • Gaseous secondary electrons detector (GSED) for ESEM applications. More details in ESEM.
  • Gaseous analytical detector (GAD) for ESEM applications. More details in ESEM.
  • Wet scanning-transmission electron microscopy detector (Wet-STEM) for ESEM applications.